Title :
Improving the scan rate and image quality in tapping Mode Atomic Force Microscopy with piezoelectric shunt control
Author :
Fairbairn, Matthew W. ; Moheimani, S. O Reza ; Fleming, Andrew J.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
Abstract :
The scan rate of tapping mode Atomic Force Microscopy (AFM), when scanning in air, may be improved by reducing the quality (Q) factor of the micro-cantilever. Passive piezoelectric shunt control is implemented in the AFM by placing an electrical impedance in series with the cantilever tip oscillation circuit. This method is used to reduce the Q factor of a piezoelectric self actuating AFM micro-cantilever by a factor of 8. Experimental results demonstrate that scan rate and image quality may be improved significantly using this method.
Keywords :
Q-factor; atomic force microscopy; cantilevers; electric impedance imaging; image scanners; micromechanical devices; oscillators; piezoelectric actuators; cantilever tip oscillation circuit; electrical impedance; image quality improvement; passive piezoelectric shunt control; piezoelectric self actuating AFM microcantilever; quality factor; scan rate improvement; tapping mode atomic force microscopy; Force; Impedance; Probes; Q factor; Shunt (electrical); Surfaces; Transfer functions;
Conference_Titel :
Australian Control Conference (AUCC), 2011
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4244-9245-9
