Title :
EMC immunity of an integrated low side driver circuit under varying RF loads
Author :
Nzalli, Hermann ; Lautensack, Christian ; Wilkening, Wolfgang ; Jansen, Rolf H.
Author_Institution :
Robert Bosch GmbH (AE/EIM), Reutlingen, Germany
Abstract :
We present EMC immunity investigations for an integrated low side driver circuit in Smart Power technology. The output (drain) voltage is monitored while it is subjected to direct power injection (DPI). DPI immunity is characterized for different load conditions. The results show that robustness significantly differs for different types of RF loads and provide a quantification. Control of the load dependence of immunity is relevant especially for IC-Pins which are connected directly to external circuitry or wiring.
Keywords :
driver circuits; electromagnetic compatibility; radiofrequency integrated circuits; DPI; EMC immunity; IC-pin; RF load; Smart Power technology; direct power injection; integrated low side driver circuit; load dependence immunity; output drain voltage monitoring; Frequency measurement; Immunity testing; Impedance; Logic gates; Radio frequency; Transistors; EMC (Electromagnetic compatibility); RF immunity; direct power injection (DPI); low side driver; variable load;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6
