Title :
Measurements of EMI susceptibility in ultra-low-voltage OpAmps
Author_Institution :
Dept. of Electron., Univ. of Brescia, Brescia, Italy
Abstract :
With the increasing use of low voltage portable devices, analog circuits with low power consumption and ultra low voltage supply are needed. In this circuits the susceptibility to electromagnetic interferences has not deeply investigated. In this paper, the effects of interferences in an ultra low voltage CMOS amplifier designed to have high EMI immunity have been measured and the results have been compared to that of an ultra low voltage commercial amplifier.
Keywords :
CMOS analogue integrated circuits; analogue integrated circuits; electromagnetic interference; low-power electronics; operational amplifiers; CMOS amplifier; EMI susceptibility measurements; analog circuits; electromagnetic interference; low power consumption; low voltage portable devices; ultra low voltage commercial amplifier; ultra-low-voltage OpAmps; CMOS integrated circuits; Electromagnetic compatibility; Electromagnetic interference; Electromagnetics; Low voltage; CMOS; Immunity to Electromagnetic Interferences; Integrated Circuits; Operational Amplifier;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6
