Assessment of the radiated immunity of integrated circuits in the 3–40 GHz range

This paper investigates the effects of pulsed local radiated electromagnetic injection on a custom digital integrated circuit from 3 to 40 GHz. The influence of several parameters (carrier frequency, amplitude, pulse width and period) is illustrated, discussed and compared with available results from the literature on different technologies. These experiments highlight that electromagnetic immunity weaknesses can appear in this frequency range for a relatively low injection power. Finally, some interpretations of these susceptibility phenomena are given.