DocumentCode :
560454
Title :
Novel modeling strategy for a BCI set-up applied in an automotive application: An industrial way to use EM simulation tools to help hardware and ASIC designers to improve their designs for immunity tests
Author :
Durier, Andre ; Pues, H. ; Vande Ginste, Dries ; Chernobryvko, Mykola ; Gazda, C. ; Rogier, Hendrik
Author_Institution :
Automotive Quality Labs. EMC Design Support, Continental Automotive France SAS, Toulouse, France
fYear :
2011
fDate :
6-9 Nov. 2011
Firstpage :
41
Lastpage :
46
Abstract :
Electronics suppliers of automotive industry use BCI (Bulk Current Injection) measurements to qualify immunity robustness of their equipment whereas electronics components manufacturers use DPI (Direct Power Injection) to qualify immunity of their component. Due to harness resonances, levels obtained during a BCI test exceed standard DPI requirements imposed by automotive suppliers onto components´ manufacturers. We propose to use BCI set-up modeling to calculate the equivalent DPI level obtained at the component level during equipment testing and to compare results with DPI measurements realized at IC level.
Keywords :
application specific integrated circuits; automotive electronics; electromagnetic compatibility; immunity testing; integrated circuit testing; ASIC design; EM simulation tools; automotive application; automotive industry; bulk current injection; direct power injection; equipment testing; immunity tests; integrated circuit testing; Application specific integrated circuits; Immunity testing; Integrated circuit modeling; Load modeling; Probes; Solid modeling; BCI; DPI; IC immunity; modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6
Type :
conf
Filename :
6130048
Link To Document :
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