DocumentCode :
560459
Title :
Automotive RF immunity test set-up analysis: Why test results can´t compare …
Author :
Coenen, Mart ; Pues, Hugo ; Bousquet, Thierry
Author_Institution :
EMCMCC bv, Eindhoven, Netherlands
fYear :
2011
fDate :
6-9 Nov. 2011
Firstpage :
71
Lastpage :
75
Abstract :
Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.
Keywords :
immunity testing; integrated circuit testing; ISO bulk-current injection; automotive RF immunity test set-up analysis; radiated immunity module-level tests; Immunity testing; Impedance; Integrated circuits; Metals; Radio frequency; Vehicles; Bulk Current injection (BCI); Direct Power Injection (DPI); Electronic Control Unit (ECU) and Electronic Sub-Assembly (ESA); Radiated Immunity (RI); TEM cell; automotive module; wire harness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6
Type :
conf
Filename :
6130053
Link To Document :
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