• DocumentCode
    560459
  • Title

    Automotive RF immunity test set-up analysis: Why test results can´t compare …

  • Author

    Coenen, Mart ; Pues, Hugo ; Bousquet, Thierry

  • Author_Institution
    EMCMCC bv, Eindhoven, Netherlands
  • fYear
    2011
  • fDate
    6-9 Nov. 2011
  • Firstpage
    71
  • Lastpage
    75
  • Abstract
    Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.
  • Keywords
    immunity testing; integrated circuit testing; ISO bulk-current injection; automotive RF immunity test set-up analysis; radiated immunity module-level tests; Immunity testing; Impedance; Integrated circuits; Metals; Radio frequency; Vehicles; Bulk Current injection (BCI); Direct Power Injection (DPI); Electronic Control Unit (ECU) and Electronic Sub-Assembly (ESA); Radiated Immunity (RI); TEM cell; automotive module; wire harness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
  • Conference_Location
    Dubrovnik
  • Print_ISBN
    978-1-4577-0862-6
  • Type

    conf

  • Filename
    6130053