Title :
Power supply current analysis of micro-controller with considering the program dependency
Author :
Wada, Osami ; Saito, Yoshiyuki ; Nomura, Katsuya ; Sugimoto, Yukishige ; Matsushima, Tohlu
Author_Institution :
Grad. Sch. of Eng., Kyoto Univ., Kyoto, Japan
Abstract :
To simulate power supply noise of an LSI, an EMC macro-model, LECCS-core, is under development. The LECCS-core model consists of a linear equivalent circuit and equivalent current sources. In this paper, program-dependent current elements are extracted for functional blocks of a microcontroller. By combining these component currents with considering the program sequence, the power supply current is simulated both in time domain and frequency domain. Even when the LSI runs different programs with different clock frequencies, noise spectra consisting of harmonics and sub-harmonics are reproduced in good agreement with measured data.
Keywords :
constant current sources; electromagnetic compatibility; equivalent circuits; frequency-domain analysis; large scale integration; microcontrollers; time-domain analysis; EMC macromodel; LECCS-core; LSI; clock frequency; equivalent current sources; frequency domain; linear equivalent circuit; microcontroller; noise spectra; power supply current analysis; power supply noise; program dependency; program-dependent current elements; time domain; Clocks; Current measurement; Electromagnetic compatibility; Integrated circuit modeling; Noise; Random access memory; Registers; EMC macro-model; LECCS-core model; current elements; current simulation; program dependency;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6
