Title :
Modeling of simultaneous switching noise effects on jitter characteristics of delay locked loop in a hierarchical system of chip-Package-PCB
Author :
Shim, Yujeong ; Bae, Bumhee ; Koo, Koungchoul ; Kim, Joungho
Author_Institution :
Div. of Electr. Engineerin, Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Abstract :
A new model is proposed to estimate simultaneous switching noises (SSNs) effects on clock jitter of delay locked loop (DLL) in a hierarchical system of chip, package and PCB. This method is to investigate the SSN coupling paths and effects on the clock jitter. It combines an analytical model of the circuit with a power distributed network (PDN) and interconnection models at the chip and package substrate. To validate the proposed model, DLL was fabricated using TSMC 0.18 um. It was successfully demonstrated that the experimental results are consistent with the predictions generated using the proposed model. It is confirmed that the jitter transfer function is strongly dependent on the SSN frequency and the PDN impedance profile of the chip-package hierarchical PDN.
Keywords :
chip-on-board packaging; clocks; delay lock loops; integrated circuit interconnections; printed circuits; timing jitter; transfer functions; SSN coupling paths; TSMC; chip package PCB; chip-package hierarchical PDN; clock jitter; delay locked loop; hierarchical system; interconnection models; jitter transfer function; package substrate; power distributed network; size 0.18 mum; switching noise effects; Clocks; Couplings; Delay; Impedance; Integrated circuit modeling; Jitter; Noise; Electromagnetic noise; Power distribution lines; Power distribution noise; circuit modeling; impedance matrix;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6