DocumentCode
560469
Title
Modeling and analysis of power supply noise effects on analog-to-digital converter in 3DIC
Author
Bae, Bumhee ; Shim, Yujeong ; Cho, Jonghyun ; Kim, Joungho
Author_Institution
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear
2011
fDate
6-9 Nov. 2011
Firstpage
198
Lastpage
202
Abstract
In this paper, the modeling and analysis of power supply noise effects on analog-to-digital converter (ADC) with chip-Package-PCB hierarchical power distribution network (PDN) is proposed. Especially, this research is focused on the PDN structure, which includes power/ground Through-Silicon-Via (TSV) for the case study of various PDN structures. The analysis was progressed with a frequency range from 1MHz to 3GHz. Analysis results indicate that ADC performance is degraded by power supply noise and it depends on PDN structures. The performance of ADC which interconnected by TSV was worse than that of ADC which interconnected by wirebond, because TSV has lower inductance than wire-bond.
Keywords
analogue-digital conversion; chip-on-board packaging; distribution networks; integrated circuit interconnections; lead bonding; power supply circuits; printed circuits; three-dimensional integrated circuits; 3DIC; PDN structure; TSV interconnection; analog-to-digital converter; chip-package-PCB; frequency 1 MHz to 3 GHz; hierarchical power distribution network; power supply noise effects; through-silicon-via; wire bond; Couplings; Integrated circuit modeling; Mathematical model; Noise; Power supplies; System-on-a-chip; Through-silicon vias; ADC; PDN; Power Supply Noise; SSN; TSV;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location
Dubrovnik
Print_ISBN
978-1-4577-0862-6
Type
conf
Filename
6130063
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