DocumentCode :
560481
Title :
Impact of GND-PTH stitches in DDR3/GDDR3/GDDR5 Memory controller packages
Author :
Ahmad, Hany ; Badesha, Amolak
Author_Institution :
Agilent Technol. Inc., Santa Clara, CA, USA
fYear :
2011
fDate :
6-9 Nov. 2011
Firstpage :
99
Lastpage :
104
Abstract :
DDR3 and GDDR3/5 memory technology running in the Giga-bit range require 3D EM accurate modeling of RF phenomena such as the impact of G ND-PTH stitches (G round Plated Through Hole) used to connect reference ground-planes in the Memory controller packages (MCH-PKG). Cost-reduction requires minimizing the number of layers and vias on MCH-PKG (micro-vias and PTH). Layout-Designers usually revert to reduce the GND-PTH without studying the impact on the performance. In this paper, Method of Moments (MoM) is used to study the impact of GND-PTH on data eye-opening as well as on Radiated-Emission of a DDR3 two-SODIMMs/channel running at 1.33GB/s.
Keywords :
DRAM chips; controllers; low-power electronics; method of moments; GDDR3; GDDR5; GND-PTH stitches; memory controller packages; method of moments; Conferences; Electromagnetic compatibility; Memory management; Moment methods; Scattering parameters; Solid modeling; Three dimensional displays; Antenna-Gain; Convolution time-domain ADS engine; DDR3; GDDR3/5; GND-PTH; Memory-controller-package; Method of Moments; Radiated-Emission; Radiated-Emission of memory-channel; eye-diagram;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6
Type :
conf
Filename :
6130075
Link To Document :
بازگشت