Title :
A Metric for Test Set Characterization and Customization Toward Fault Diagnosis
Author :
Kundu, Sandipan ; Pal, Shovon ; Chattopadhyay, Subrata ; Sengupta, Indranil ; Kapur, R.
Author_Institution :
Dept. of CSE, Indian Inst. of Technol. Kharagpur, Kharagpur, India
Abstract :
This paper introduces a new metric to characterize test sets in terms of their diagnostic power. Our method uses much less space compared to the existing ones and is quite accurate. The metric can be utilized to increase the diagnosability of incompletely specified test sets via don´t care filling. The X-filling approach can be integrated with test pattern generation tools to aid in better diagnostic pattern set generation.
Keywords :
automatic test pattern generation; fault diagnosis; logic design; logic testing; X-filling approach; diagnostic pattern set generation; diagnostic power; don´t care filling; fault diagnosis; test pattern generation tools; test set characterization; Algorithm design and analysis; Circuit faults; Compaction; Fault diagnosis; Measurement; Test pattern generators; Fault clustering; X filling; fault diagnosis; fault dictionary; indistinguishable fault pairs;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2013.2272538
