DocumentCode :
560630
Title :
A fast-locking clock and data recovery circuit with a lock detector loop
Author :
Chen, Chih-Lin ; Wang, Chua-Chin ; Juan, Chun-Ying
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
fYear :
2011
fDate :
12-14 Dec. 2011
Firstpage :
332
Lastpage :
335
Abstract :
This work presents a PLL-based (phase-locked loop) clock and data recovery (CDR) circuit with a lock detector loop for fast locking and low jitter. We use an adjustable charge pump to change the charge current according to the state of the lock detector loop, which is determined by seven clocks with equal phase difference. An experimental prototype was implemented using a typical 0.18 μm CMOS process. The post-layout-extracted simulation results reveal that the worst case jitter of the recovery clock is less than 199.66 ps (peak-to-peak) and the settling time is less than 4 μs at all PVT (Process, voltage, and temperature) corners.
Keywords :
CMOS integrated circuits; clock and data recovery circuits; phase locked loops; CMOS process; PLL-based clock and data recovery circuit; PVT; adjustable charge pump; charge current; lock detector loop; phase-locked loop clock and data recovery circuit; post-layout-extracted simulation; size 0.18 mum; Charge pumps; Clocks; Detectors; Jitter; Radiation detectors; Synchronization; Voltage-controlled oscillators; CDR; fast-locking; lock detector loop; phase shift;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-61284-863-1
Type :
conf
DOI :
10.1109/ISICir.2011.6131964
Filename :
6131964
Link To Document :
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