DocumentCode :
560994
Title :
Copper wire bonding experiences from a manufacturing perspective
Author :
Appelt, Bernd K. ; Tseng, Andy ; Lai, Yi-Shao
Author_Institution :
ASE Group, Sunnyvale, CA, USA
fYear :
2011
fDate :
12-15 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
The rapid ramping of fine pitch copper wire bonding production is a perfect example of a market driven technology implementation. The explosive increase in gold commodity pricing has paved the road for this conversion. Several challenges known from thick copper wire bonding had to be overcome to make this technology viable technically and economically. Some fundamental studies of copper wire bonding to the full spectrum of die surfaces and wafer nodes was available at the beginning of manufacturing implementation but over the last year, a large number of research papers have been published greatly enhancing the basic understanding of mechanism, metallurgy and chemistry of copper wire bonding. Equipment manufacturers have developed dedicated copper wire bonders and tool kits, wire manufacturers have developed softer copper wires as well as oxidation resistant wires, mold compound suppliers have developed low corrosion compounds and wire bond engineers have learned to optimize the bonding process to yield cost effective and reliable copper wire bond die packages. Here, high volume manufacturing experiences of copper wire bond packaging and long term reliability data will be presented.
Keywords :
copper; fine-pitch technology; lead bonding; Cu; bonding process; copper wire bond die packages; copper wire bonders; copper wire bonding experiences; corrosion compounds; die surfaces; equipment manufacturers; fine pitch copper wire bonding production; gold commodity pricing; long term reliability data; manufacturing implementation; manufacturing perspective; market driven technology implementation; mold compound suppliers; oxidation resistant wires; thick copper wire bonding; tool kits; wafer nodes; wire bond engineers; wire manufacturers; Artificial intelligence; Bonding; Electronics packaging; High temperature superconductors; Monitoring; Semiconductor device reliability; copper wire bonding; fine wire and fine pitch; long term reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Packaging Conference (EMPC), 2011 18th European
Conference_Location :
Brighton
Print_ISBN :
978-1-4673-0694-2
Type :
conf
Filename :
6142371
Link To Document :
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