Title :
Reliable hermetic MEMS chip-scale packaging
Author :
Durante, G. Spinola ; James, R. lose ; Bosshard, C. ; Muller, C. ; Baborowski, J. ; Pezous, A. ; Cardot, F. ; Dubois, M.-A. ; Neels, A. ; Dommann, A.
Author_Institution :
CSEM Alpnach, Alpnach Dorf, Switzerland
Abstract :
Reliable hermetic MEMS chip-scale packaging has been developed and tested with gold-tin soldering on 2×1.5 mm2 chips. The test vehicle configuration consists of a glass cap with AuSn solder ring bonded onto a silicon resonator dummy chip. Through careful chip layout, UBM layer improvements and soldering process optimization, the shear tests yielded forces above 5 kg on a bonding ring area of ~0.5 mm2. With a resulting shear stress larger than 100 MPa it is now possible to address a wider application domain for vacuum-encapsulated MEMS, where highly reliable hermetic solutions are required. Promising applications of hermetic and reliable MEMS are found in the medical field and in the space domain where defect-free sealing is a must. In the consumer electronics domain, where time-to-market and cost reduction are key factors, development time can be shortened for extremely miniaturized packaged MEMS.
Keywords :
chip scale packaging; elemental semiconductors; encapsulation; gold alloys; hermetic seals; integrated circuit reliability; micromechanical devices; resonators; silicon; solders; tin alloys; AuSn; AuSn solder ring bonding; MEMS chip-scale packaging; Si; UBM layer improvements; chip layout; consumer electronics domain; defect-free sealing; glass cap; gold-tin soldering; reliable hermetic packaging; shear tests; silicon resonator dummy chip; soldering process optimization; test vehicle configuration; vacuum-encapsulated MEMS; Micromechanical devices; Robustness; MEMS; galvanic; gold-tin; hermeticity; packaging; reliability;
Conference_Titel :
Microelectronics and Packaging Conference (EMPC), 2011 18th European
Conference_Location :
Brighton
Print_ISBN :
978-1-4673-0694-2