DocumentCode :
561013
Title :
Polymer cored BGA ball reliability optimisation
Author :
Whalley, David C. ; Kristiansen, H. ; Halbo, L.
Author_Institution :
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
fYear :
2011
fDate :
12-15 Sept. 2011
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents the results from simulation studies of the mechanical performance of BGA interconnects based on the use of polymer cored solder balls (PCSBs) as an alternative to the solid solder balls that are typically used. PCSBs have previously been shown to offer improved reliability and this study was performed to improve understanding of the effects of two key PCSB design variables, i.e. metallisation thickness and polymer modulus on their fatigue performance. The results show that minimising the polymer modulus is beneficial in reducing plastic strains in both the solder and copper metallisation on the polymer ball, but that the metallisation thickness has a much less significant effect unless the polymer core modulus is extremely low.
Keywords :
ball grid arrays; fatigue; integrated circuit interconnections; integrated circuit metallisation; integrated circuit reliability; optimisation; solders; BGA interconnects; PCSB design variables; copper metallisation; fatigue performance; mechanical performance; metallisation thickness; polymer core modulus; polymer cored BGA ball; polymer cored solder balls; polymer modulus; reliability optimisation; solid solder balls; Assembly; Computational modeling; Facsimile; Optimization; Polymers; Reliability; Thermal conductivity; FEA; ball grid array; metal coated polymer spheres; polymer cored solder balls;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Packaging Conference (EMPC), 2011 18th European
Conference_Location :
Brighton
Print_ISBN :
978-1-4673-0694-2
Type :
conf
Filename :
6142392
Link To Document :
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