DocumentCode :
561031
Title :
Current industry adoption of fine-pitch Cu wire bonding and investigation focus at iNEMI
Author :
O´Malley, Grace ; Su, Peng ; Fu, Haley ; Bayes, Martin ; Tsuriya, Masahiro
fYear :
2011
fDate :
12-15 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Gold (Au) wire bonding is one of today´s most common and well understood first level interconnects. However copper (Cu) wire bonding is increasingly being used for a wide variety of components, predominantly driven by the cost benefit of Cu. As the application moves from mostly consumer products to high-reliability electronic systems, the long term reliability of fine-pitch Cu wire bonding must be better understood. A collaborative project has been launched by iNEMI (International Electronics Manufacturing Initiative) member companies to assess the current adoption landscape of Cu wire bonding in the industry, and to understand the critical factors that impact component reliability. An industrial survey has already been conducted by the project. The results of the survey not only provide a clear overview of the general application status of Cu wire bonding, but also illustrate key technical concerns such as reliability performance, materials and process capability (or optimization), and qualification standards requirements.
Keywords :
copper; fine-pitch technology; lead bonding; Cu; component reliability; fine-pitch wire bonding; Assembly; Medical services; Packaging; Process control; Qualifications; Throughput; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Packaging Conference (EMPC), 2011 18th European
Conference_Location :
Brighton
Print_ISBN :
978-1-4673-0694-2
Type :
conf
Filename :
6142413
Link To Document :
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