DocumentCode :
561052
Title :
Solidification processes of SnCu, SnAg and SnAgCu solder alloys and interface reactions to charactize solar cell interconnections processes
Author :
Schindler, Sebastian ; Wiese, Steffen
Author_Institution :
Fraunhofer-Center for Silicon Photovoltaics, Halle, Germany
fYear :
2011
fDate :
12-15 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Lead-contained and lead-free solder joints have been well studied in electronics packaging applications over the past years. Within the solar industry, establishing the Si crystalline solar cell interconnection process as an environment friendly and RoHS-conform process, more substantial investigations are necessary to prove the process reliability and characterize interconnection formation in the Ag-thick film and Cu-ribbon interfaces. This paper focuses on the evaluation of material parameters of the joining processes for solar interconnections and quantifies the solder formation of the typical PV interfaces and the solder compositions. Therefore, varying solder alloys (content gradiation of SnCu, SnAg compositions) are investigated. We used DSC (differential scanning calorimeter) measurements to characterize the melting and solidification behaviour with and without the interfacial reactions. Influencing factors like peak-temperature and cooling rate within the context of PV manufacturing process will be discussed to convey a better understanding for the Ag-paste to solder to Cu-ribbon interconnection level for solar cell stringing. The results show that the conditions of solidification behaviour and microstructural properties are of significant importance for silicon-based solar cell interconnection processes.
Keywords :
RoHS compliance; cooling; copper alloys; differential scanning calorimetry; electronics packaging; integrated circuit interconnections; integrated circuit reliability; melting; silver alloys; solar cells; solders; solidification; tin alloys; Ag-thick film; Cu; Cu-ribbon interfaces; RoHS-conform process; Si; Si crystalline solar cell interconnection; SnAg solder alloys; SnAgCu; SnAgCu solder alloys; SnCu solder alloys; cooling rate; differential scanning calorimeter; electronics packaging; interface reactions; lead-contained solder joints; lead-free solder joints; melting; microstructural properties; reliability; solidification; Cooling; Copper; Heating; Lead; Thickness measurement; joint formation; photovoltaics; process reliability; soldering; wettability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Packaging Conference (EMPC), 2011 18th European
Conference_Location :
Brighton
Print_ISBN :
978-1-4673-0694-2
Type :
conf
Filename :
6142435
Link To Document :
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