• DocumentCode
    561060
  • Title

    Copper wire bond investigation on multiple surface finishes - enabling wire bond packages without gold

  • Author

    Oezkoek, Mustafa ; White, Nigel ; Clauberg, Horst

  • Author_Institution
    Atotech Deutschland GmbH, Berlin, Germany
  • fYear
    2011
  • fDate
    12-15 Sept. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    During the past two years, fine pitch copper wire bonding has finally entered high volume production. It is estimated that nearly 15% of all wire bonders used in production are now equipped for copper wire bonding. Most of these are used exclusively for copper wire bonding. In terms of pitch, copper wire is only barely lagging behind the most advanced gold applications. The most commonly used copper wire is 20um in diameter and 18um copper wire is entering final qualification. Evaluations with even finer wire are underway.
  • Keywords
    copper; electronics packaging; lead bonding; surface finishing; Cu; copper wire bond investigation; fine pitch copper wire bonding; multiple surface finishes; wire bond packages; Copper; Gold; Nickel; Plasmas; Reliability; Silver; Wires; ENEP; ENEPIG; copper wire bonding; gold wire bonding; pure Palladium; wire bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Packaging Conference (EMPC), 2011 18th European
  • Conference_Location
    Brighton
  • Print_ISBN
    978-1-4673-0694-2
  • Type

    conf

  • Filename
    6142443