DocumentCode :
56155
Title :
Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches
Author :
Sismanoglou, Panagiotis ; Nikolos, Dimitris
Author_Institution :
Dept. of Comput. Eng. & Inf., Univ. of Patras, Patras, Greece
Volume :
32
Issue :
11
fYear :
2013
fDate :
Nov. 2013
Firstpage :
1762
Lastpage :
1775
Abstract :
In this paper, we present a new test data compression method for intellectual property (IP) cores testing, based on the reuse of parts of dictionary entries. Two approaches are investigated: the static and the dynamic. In the static approach, the content of the dictionary is constant during the testing of a core, while in the dynamic approach the testing of a core consists of several test sessions and the content of the dictionary is different during each test session. The efficiency of the proposed method is supported with extensive simulation results and comparisons to already known test data compression methods suitable for IP cores testing.
Keywords :
automatic test equipment; data compression; dictionaries; logic circuits; logic testing; IP cores testing; dictionary entries; dynamic approach; input test data compression method; intellectual property cores testing; static approach; test sessions; Dictionaries; Encoding; Heuristic algorithms; Indexes; Partitioning algorithms; Test data compression; Testing; Dictionary-based compression; embedded testing techniques; intellectual property (IP) cores; test data compression;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2013.2270433
Filename :
6634582
Link To Document :
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