Title :
Optically-connected memory with error correction for increased reliability in large-scale computing systems
Author :
Brunina, Daniel ; Lai, Caroline P. ; Liu, Dawei ; Garg, Ajay S. ; Bergman, Keren
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Abstract :
We demonstrate an optically-connected memory system with a novel advanced error-correction protocol for improved communication reliability in large-scale computing systems. An emulated microprocessor operates uninterrupted with several optically-connected memory nodes despite multiple memory data errors.
Keywords :
error correction codes; microprocessor chips; optical computing; optical interconnections; optical storage; telecommunication network reliability; communication reliability; emulated microprocessor; error correction protocol; large-scale computing systems; multiple memory data errors; optically-connected memory; Adaptive optics; Error correction codes; Memory management; Optical fiber networks; Optical interconnections; Optical scattering; SDRAM;
Conference_Titel :
Optical Fiber Communication Conference and Exposition (OFC/NFOEC), 2012 and the National Fiber Optic Engineers Conference
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-1-4673-0262-3
