DocumentCode
562823
Title
Realization of spin-torque transfer magnetoresistive RAM
Author
Mandhdapu, Ramakrushna ; Immanuel, J. Samson
Author_Institution
Dept. of ECE, Karunya Univ., Coimbatore, India
fYear
2012
fDate
30-31 March 2012
Firstpage
513
Lastpage
517
Abstract
Spin-torque transfer (STT) programming is a promising, maturing, non-volatile memory technology for future memory applications. When a sufficient current density passes through the MTJ, the spin polarized current will exert a spin transfer torque to switch the magnetization of the free layer. This is the fundamental of the write mechanism in STT-RAM, current induced magnetization switching. It allows STT-RAM to have a smaller cell size and write current than MRAM.The new MRAM cell structure design can realize high speed and reliable sensing operations in the presence of relatively poor magnetoresistive ratio, while maintain the low sensing current through the magnetic tunnelling junctions (MTJs). The effectiveness of the proposed RAM structure was demonstrated by circuit simulation at 0.18μm CMOS technology using Mentor Graphics tool.
Keywords
circuit simulation; logic design; random-access storage; CMOS technology; MRAM cell structure design; Mentor Graphics tool; STT programming; STT-RAM write mechanism; cell size; circuit simulation; complimentary metal oxide semiconductor; current induced magnetization switching; free layer magnetization; magnetic tunnelling junction; nonvolatile memory technology; random access memory; sensing operation; size 0.18 mum; spin polarized current; spin-torque transfer programming; write current; Logic gates; Magnetic tunneling; Magnetic tunneling junction (MTJ); magnetoresistive random access memory (MRAM); spin torque transfer (STT) magnetoresistive memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in Engineering, Science and Management (ICAESM), 2012 International Conference on
Conference_Location
Nagapattinam, Tamil Nadu
Print_ISBN
978-1-4673-0213-5
Type
conf
Filename
6216056
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