DocumentCode :
563466
Title :
GIMIC-O - A low cost non-epitaxial bipolar LSI technology suitable for application to TTL circuits
Author :
Panousis, P.T. ; Pritchett, R.L.
Author_Institution :
Bell Telephone Labs., Inc., Allentown, PA, USA
fYear :
1974
fDate :
9-11 Dec. 1974
Firstpage :
515
Lastpage :
518
Abstract :
A bipolar technology has been developed which is directed toward low power LSI applications at a wafer processing cost below those of MOS technologies. The structure uses the basic concepts of the triple diffused technology which requires neither an epitaxial nor buried layer; however, ion implantation of both the collector and base provide parameter control not possible with triple diffusion. The use of an ion implanted self-isolated collector region which is lightly doped provides small size and low capacitance; this region is also used for the formation of Schottky diodes. Well controlled, ion implanted resistors can be fabricated in both the base (p-type - 600Ω/□) and collector (n-type -700Ω/□) and substrate PNP´s with β ~ 10 are also available. The transistors show a peak fT = 1GHz which makes them suitable even for high speed applications. At present the technology is finding extensive use in low power Schottky clamped TTL circuits where it meets all the standard circuit requirements for that family.
Keywords :
Schottky diodes; UHF integrated circuits; bipolar integrated circuits; bipolar logic circuits; buried layers; ion implantation; large scale integration; low-power electronics; resistors; semiconductor epitaxial layers; transistor-transistor logic; GIMIC-O; MOS technology; Schottky diodes; TTL circuits; bipolar technology; buried layer; epitaxial layer; frequency 1 GHz; guard-ring isolated monolithic integrated circuit; ion implanted resistors; ion implanted self-isolated collector region; low cost nonepitaxial bipolar LSI technology; low power LSI applications; low power Schottky clamped TTL circuits; triple diffused technology; wafer processing; Capacitance; Large scale integration; Lead; Schottky diodes; Substrates; Surface treatment; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 1974 International
Conference_Location :
Washington, DC
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1974.6219674
Filename :
6219674
Link To Document :
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