Title :
A low-noise CCD input with reduced sensitivity to threshold voltage
Author :
Emmons, S.P. ; Tasch, A.F., Jr. ; Caywood, J.M.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
A CCD input structure is presented which derives the injected charge from the difference between two voltage levels on a capacitive node, where both levels are set using the same IGFET structure; near perfect threshold voltage cancellation is predicted. Data are presented which show spatial variations on a multiple input structure at least an order of magnitude less than those achieved using previously reported input techniques.
Keywords :
charge-coupled devices; insulated gate field effect transistors; sensitivity analysis; IGFET structure; capacitive node; low-noise CCD input structure; near perfect threshold voltage cancellation; Abstracts; Charge coupled devices; Logic gates; Multiplexing; Sensitivity;
Conference_Titel :
Electron Devices Meeting (IEDM), 1974 International
Conference_Location :
Washington, DC
DOI :
10.1109/IEDM.1974.6219744