DocumentCode
563483
Title
A low-noise CCD input with reduced sensitivity to threshold voltage
Author
Emmons, S.P. ; Tasch, A.F., Jr. ; Caywood, J.M.
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
1974
fDate
9-11 Dec. 1974
Firstpage
233
Lastpage
235
Abstract
A CCD input structure is presented which derives the injected charge from the difference between two voltage levels on a capacitive node, where both levels are set using the same IGFET structure; near perfect threshold voltage cancellation is predicted. Data are presented which show spatial variations on a multiple input structure at least an order of magnitude less than those achieved using previously reported input techniques.
Keywords
charge-coupled devices; insulated gate field effect transistors; sensitivity analysis; IGFET structure; capacitive node; low-noise CCD input structure; near perfect threshold voltage cancellation; Abstracts; Charge coupled devices; Logic gates; Multiplexing; Sensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 1974 International
Conference_Location
Washington, DC
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1974.6219744
Filename
6219744
Link To Document