• DocumentCode
    563483
  • Title

    A low-noise CCD input with reduced sensitivity to threshold voltage

  • Author

    Emmons, S.P. ; Tasch, A.F., Jr. ; Caywood, J.M.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1974
  • fDate
    9-11 Dec. 1974
  • Firstpage
    233
  • Lastpage
    235
  • Abstract
    A CCD input structure is presented which derives the injected charge from the difference between two voltage levels on a capacitive node, where both levels are set using the same IGFET structure; near perfect threshold voltage cancellation is predicted. Data are presented which show spatial variations on a multiple input structure at least an order of magnitude less than those achieved using previously reported input techniques.
  • Keywords
    charge-coupled devices; insulated gate field effect transistors; sensitivity analysis; IGFET structure; capacitive node; low-noise CCD input structure; near perfect threshold voltage cancellation; Abstracts; Charge coupled devices; Logic gates; Multiplexing; Sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 1974 International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1974.6219744
  • Filename
    6219744