Title :
Study of the CVI 18.2nm line in a capillary discharge
Author :
Gotou, T. ; Takahashi, Y. ; Kobayashi, H. ; Taniike, A. ; Kitamura, A.
Author_Institution :
Kobe University of Mercantile Marine, 5-1-1 Fukaeminami-machi, Higashinada-ku, 658-0022, Japan
Abstract :
Aiming at the development of short wavelength (XUV or soft X-ray) laser devices of the tabletop size, characteristics of a capillary tube discharge are examined. Time-integrated XUV spectra are analyzed with a flat-field grazing-incidence spectrometer equipped with a 1200 line/mm grating. The spatial distribution of the 18.2-nm transition intensity of CVI and its dependence on the discharge parameters such as the capillary length, the diameter and the discharge voltage are discussed.
Keywords :
Photonics; Polyethylene; CVI 18.2-nm line; pulsed capillary discharge; recombination scheme; soft X-ray;
Conference_Titel :
High-Power Particle Beams, 2000 13th International Conference on
Conference_Location :
Nagaoka, Japan
