DocumentCode :
563626
Title :
Photocurrent characteristics of oxygenated fullerene thin film
Author :
Yang, Sung-Chae ; Mien, Tetsu
Author_Institution :
Satellite Venture Business Laboratory, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8561, Japan
fYear :
2000
fDate :
20-25 June 2000
Firstpage :
805
Lastpage :
808
Abstract :
In order to obtain the higher photocurrent in metal/insulator/semiconductor junction cells, oxygenated fullerene thin films are used as the insulator thin film. The highly oxygenated fullerene thin films are obtained by using RF O2 plasma with cooling system. From the experimental results, it is found that oxygenated fullerene thin films, C60Ox (x=8, 16, 24, 38, 50 etc.), are obtained by using a laser-desorption time-of-flight mass spectrometer (TOF-MS). By using the 200 nm in thick multilayer fullerene junction film, the photocurrent becomes 30 times larger that of normal fullerene.
Keywords :
Electrodes; Lighting; Measurement by laser beam; Optical films; Optical polymers; Photoconductivity; RF plasma; multiplayer film; oxygenated fullerene; photocurrent; photoelectric device;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Power Particle Beams, 2000 13th International Conference on
Conference_Location :
Nagaoka, Japan
Type :
conf
Filename :
6219990
Link To Document :
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