DocumentCode
563672
Title
Radioactive reliability of programmable memories
Author
Loncar, B. ; Osmokrovic, P. ; Stojanovic, M.
Author_Institution
Faculty of Technology and Metallurgy, University of Belgrade, Karnegijeva 4, P.O.Box 3554, 11000, Yugoslavia
fYear
2000
fDate
20-25 June 2000
Firstpage
992
Lastpage
995
Abstract
The aim of this paper is to examine the reliability of EPROM and EEPROM components under the influence of gamma radiation. This problem is significant for military industry and space technology. Total dose results are presented for the JL 27C512D EPROM and 28C64C EEPROM components. There is evidence that EPROM components have better radioactive reliability than EEPROM components. Also, the EPROM´s changes are reversible and after erasing process and reprogramming EPROM components are functional. On the other hand EEPROM´s changes are irreversible and under the influence of gamma radiation all EEPROM components became permanently nonfunctional. The obtained results are analyzed and explained via the interaction of gamma radiation with oxide layers.
Keywords
Argon; EPROM; Logic gates; Repeaters; EEPROM; EPROM; gamma radiation; radioactive reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Power Particle Beams, 2000 13th International Conference on
Conference_Location
Nagaoka, Japan
Type
conf
Filename
6220036
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