DocumentCode :
563943
Title :
Application of high-power ion beams to thin films deposition and stimulating mass transfer of previously implanted dopants in materials
Author :
Ryabchikov, Alexandr I. ; Matvienko, Vasily M. ; Petrov, Anatoli V. ; Struts, Vasily K. ; Usov, Yuri P. ; Shlapakovski, Anatoli S.
Author_Institution :
Nucl. Phys. Inst., Tomsk Polytech. Univ., Tomsk, Russia
fYear :
2004
fDate :
18-23 July 2004
Firstpage :
622
Lastpage :
625
Abstract :
The results of investigations concerning some applications of high-power ion beams (HPIBs) to materials surface modification are presented. For HPIB-based film deposition, the characteristics of obtained coatings were studied depending on deposition conditions. It has been shown that mechanical and adhesion properties of the films are improved with decreasing deposition rate. For the combined surface treatment comprising traditional ion implantation and HPIB irradiation, the mass transfer of implanted dopant was investigated at multiple implantation-irradiation cycles. It has been demonstrated that one can control the depth of occurrence and storage of the implanted dopant.
Keywords :
adhesion; coatings; ion beam assisted deposition; ion implantation; mass transfer; surface treatment; thin films; HPIB irradiation; HPIB-based film deposition; adhesion properties; coatings; high-power ion beams; implanted dopants; mass transfer; mechanical properties; multiple implantation-irradiation cycles; stimulating mass transfer; surface modification; surface treatment; thin film deposition; traditional ion implantation; Coatings; Rough surfaces; Silicon; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Power Particle Beams (BEAMS 2004), 2004 International Conference on
Conference_Location :
St. Petersburg
Print_ISBN :
978-5-87911-088-3
Type :
conf
Filename :
6220622
Link To Document :
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