Title :
Temperature and supply voltage compensated biasing for digitally controlled oscillators
Author :
Höppner, Sebastian ; Haenzsche, Stefan ; Hartmann, Stephan ; Schiefer, Stefan ; Schüffny, René
Author_Institution :
Fac. of Electr. Eng. & Inf. Technol., Tech. Univ. Dresden, Dresden, Germany
Abstract :
This paper presents a current bias circuit for digitally controlled oscillators (DCOs). It consists of three individual current components with different supply voltage and temperature sensitivities and thereby allows to effectively compensate period variations with respect to supply voltage and temperature. This reduces the required fine tuning range for ADPLL application of the DCO. The concept is proven by a DCO circuit implementation in 65nm CMOS technology and verified by simulations and testchip measurements.
Keywords :
CMOS digital integrated circuits; digital phase locked loops; integrated circuit testing; oscillators; ADPLL; CMOS technology; current bias circuit; digitally controlled oscillators; size 65 nm; supply voltage compensated biasing; temperature compensated biasing; testchip measurements; Clocks; Oscillators; Switches; System-on-a-chip; Temperature dependence; Temperature sensors; Tuning; ADPLL; DCO; current bias; supply voltage compensation; temperature compensation;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference
Conference_Location :
Warsaw
Print_ISBN :
978-1-4577-2092-5
