A high speed A/D converter for using in low power CMOS image sensors

Author

Teymouri, Masood ; Alizadeh, Banafsheh ; Dadashi, Ali ; Mahmoudi, Azad

Author_Institution

Innovation Res. Center, Urmia Univ. of Technol., Urmia, Iran

fYear

2012

fDate

24-26 May 2012

Firstpage

192

Lastpage

197

Abstract

This paper presents a high speed, high resolution column-parallel ADC with global digital error correction. Proposed A/D converter is suitable for using in high-frame-rate CMOS image sensors. This new method has more valuable than conventional ramp ADC from viewpoint of speed and resolution. A prototype 11-bit ADC is implemented in 0.25 μm CMOS technology. Moreover, an overall SNR of 63.8 dB can be achieved at 0.5 Msample/s. The power dissipation of all 320 column-parallel ADCs with the peripheral circuits consume 76 mW at 2.5V supplies.

Keywords

CMOS image sensors; analogue-digital conversion; error correction; low-power electronics; CMOS technology; SNR; column-parallel ADC; global digital error correction; high speed A/D converter; high speed high resolution column-parallel ADC; high-frame-rate CMOS image sensors; low power CMOS image sensors; peripheral circuits; power 76 mW; power dissipation; size 0.25 mum; voltage 2.5 V; word length 11 bit; CMOS integrated circuits; CMOS technology; Clocks; Generators; Layout; Radiation detectors; Random access memory; Column parallel ADC; Comparator; Digital correction; High frame rate image sensor; Single slope ADC; Two Step ADC;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference

Conference_Location

Warsaw

Print_ISBN

978-1-4577-2092-5

Type

conf

Filename

6226199