DocumentCode :
56418
Title :
A Size-Dependent Continuum Model for Nanoscale Circular Plates
Author :
Liu, Cong ; Rajapakse, R.K.N.D.
Author_Institution :
Fac. of Appl. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Volume :
12
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
13
Lastpage :
20
Abstract :
Nanoscale circular plates are encountered in several nanotechnology-based devices such as nanoelectromechanical systems. Structures are size dependent at nanoscale due to surface energy effects. It is possible to capture such size dependence through special continuum models. In this paper, the Gurtin-Murdoch continuum theory is applied to develop a new continuum mechanics model for static deformation of thin and thick circular nanoplates. The relevant governing equations are established from basic principles. It is shown that the governing equations possess a closed-form analytical solution that makes the current approach suitable for device analysis and design. A series of closed-form analytical solutions is presented for static bending of thin and thick plates under common static loading (uniformly distributed and center point) and boundary conditions (simply supported and clamped edges). The analytical solution for a thin plate supported by a linear elastic substrate is also presented. Deflection profiles of selected silicon and aluminum plates are presented and compared with the classical plate theory results to examine the salient features of mechanical response and influence of surface elastic moduli, surface residual stress, and boundary conditions.
Keywords :
bending; nanostructured materials; nanotechnology; plates (structures); Gurtin-Murdoch continuum theory; closed form analytical solution; linear elastic substrate; nanoelectromechanical systems; nanoscale circular plate; nanotechnology based device; size dependent continuum model; static bending; static deformation; surface energy effect; Boundary conditions; Equations; Materials; Mathematical model; Nanoscale devices; Stress; Zirconium; Displacement measurement; flexible structures; force; mechanical systems; plates; strain; stress; thin film devices;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2012.2224880
Filename :
6331012
Link To Document :
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