DocumentCode :
564772
Title :
Heterogeneous GaAs - Si bonded stack
Author :
Zhu Jian ; Erwin, H. ; Wu Jing ; Shi Guixiong
Author_Institution :
Nanjing Electron. Devices Inst., Nanjing, China
fYear :
2012
fDate :
25-27 April 2012
Firstpage :
72
Lastpage :
75
Abstract :
In this paper transition layer is used for heterogeneous stack substrate bonding between GaAs and Si which includes Wafer to Wafer bonding technology and GaAs MMIC Die to Si wafer bonding technology. In consideration of the different thermal expansion coefficient between GaAs and Si,low temperature metal eutectic bonding was adopted for heterogeneous substrate bonding. It´s succeeding to heterogeneous integration between GaAs and Si by research AuSn material and bonding process. Energy spectrum of SEM is used to analyze the ratio of AuSn transition layer which is 80:20 and therefore the result of heterogeneous integration is perfect.
Keywords :
III-V semiconductors; MMIC; gallium arsenide; microwave materials; scanning electron microscopy; silicon; wafer bonding; GaAs-Si; MMIC die to wafer bonding technology; SEM energy spectrum; heterogeneous bonded stack; heterogeneous stack substrate bonding; heterogeneous substrate bonding; low-temperature metal eutectic bonding; thermal expansion coefficient; wafer to wafer bonding technology; Bonding; Films; Gallium arsenide; Metals; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2012 Symposium on
Conference_Location :
Cannes
Print_ISBN :
978-1-4673-0785-7
Type :
conf
Filename :
6235312
Link To Document :
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