Title : 
A semiempirical model for wakeup time estimation in power-gated logic clusters
         
        
            Author : 
Tovinakere, Vivek D. ; Sentieys, Olivier ; Derrien, Steven
         
        
            Author_Institution : 
INRIA/IRISA, Univ. of Rennes 1, Lannion, France
         
        
        
        
        
        
            Abstract : 
Wakeup time is an important overhead that must be determined for effective power gating, particularly in logic clusters that undergo frequent mode transitions for run-time leakage power reduction. In this paper, a semiempirical model for virtual supply voltage in terms of basic parameters of the power-gated circuit is presented. Hence a closed-form expression for estimation of wakeup time of a power-gated logic cluster is derived. Experimental results of application of the model to ISCAS85 benchmark circuits show that wakeup time may be estimated within an average error of 16.3% across 22× variation in sleep transistor sizes and 13× variation in circuit sizes with significant speedup in computation time compared to SPICE level circuit simulations.
         
        
            Keywords : 
SPICE; benchmark testing; circuit simulation; logic gates; logic testing; power aware computing; ISCAS85 benchmark circuits; SPICE level circuit simulations; closed-form expression; power gating; power-gated circuit; power-gated logic clusters; run-time leakage power reduction; semiempirical model; virtual supply voltage; wakeup time estimation; Estimation; Integrated circuit modeling; Leakage current; Logic gates; Steady-state; Switching circuits; Transistors; Design automation; leakage current; power gating; wakeup time;
         
        
        
        
            Conference_Titel : 
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
         
        
            Conference_Location : 
San Francisco, CA
         
        
        
            Print_ISBN : 
978-1-4503-1199-1