Title :
Examination and Analysis of Critical Current Uniformity of Long HTS Tapes by the MCorder
Author :
Shengnan Zou ; Chen Gu ; Timing Qu ; Siwei Chen ; Xiaohang Li ; Zhenghe Han
Author_Institution :
Dept. of Phys., Tsinghua Univ., Beijing, China
Abstract :
The magnetic circuit (MC) method has been developed to measure the critical current (Ic) of long high temperature superconductor (HTS) tapes continuously since 2010. So far, with the apparatus based on the MC method, namely MCorder, industrial HTS tapes produced by main manufactures worldwide have been measured using the MC method, including Bi2223/Ag multifilament tapes and coated conductors with/without magnetic substrates. The high speed (360 m/h), high accuracy measurement (resolution 1 A) and its adaption to all kinds of HTS tapes make large quantity measurement and statistical evaluation of HTS tape possible. In this paper, criteria for Ic assessment of long HTS tapes is discussed, based on which analysis of samples from different manufacturers worldwide is provided. The measurement result of a Bi2223/Ag tape by MC method is compared with section-by-section four-probe method, and the two methods show good agreement. Fourier analysis is given for analyzing Ic periodicity of a tape with periodical artificial defects.
Keywords :
Fourier analysis; bismuth compounds; calcium compounds; critical currents; high-temperature superconductors; multifilamentary superconductors; silver; statistical analysis; strontium compounds; superconducting tapes; Bi2223-Ag multifilament tapes; Bi2Sr2Ca2Cu3O10+x-Ag; Fourier analysis; MCorder; coated conductors; critical current uniformity; long HTS tapes; long high temperature superconductor tapes; magnetic circuit method; magnetic substrates; periodical artificial defects; section-by-section four-probe method; statistical evaluation; Critical current density (superconductivity); Current measurement; High-temperature superconductors; Magnetic circuits; Superconducting integrated circuits; Superconducting magnets; Critical Current Uniformity; Critical current uniformity; Fourier; HTS tape; Magnetic Circuit; Statistics; magnetic circuit; statistics;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2374418