Examination and Analysis of Critical Current Uniformity of Long HTS Tapes by the MCorder

Author

Shengnan Zou ; Chen Gu ; Timing Qu ; Siwei Chen ; Xiaohang Li ; Zhenghe Han

Author_Institution

Dept. of Phys., Tsinghua Univ., Beijing, China

Volume

25

Issue

3

fYear

2015

fDate

Jun-15

Firstpage

1

Lastpage

4

Abstract

The magnetic circuit (MC) method has been developed to measure the critical current (I_c) of long high temperature superconductor (HTS) tapes continuously since 2010. So far, with the apparatus based on the MC method, namely MCorder, industrial HTS tapes produced by main manufactures worldwide have been measured using the MC method, including Bi2223/Ag multifilament tapes and coated conductors with/without magnetic substrates. The high speed (360 m/h), high accuracy measurement (resolution 1 A) and its adaption to all kinds of HTS tapes make large quantity measurement and statistical evaluation of HTS tape possible. In this paper, criteria for I_c assessment of long HTS tapes is discussed, based on which analysis of samples from different manufacturers worldwide is provided. The measurement result of a Bi2223/Ag tape by MC method is compared with section-by-section four-probe method, and the two methods show good agreement. Fourier analysis is given for analyzing I_c periodicity of a tape with periodical artificial defects.

Keywords

Fourier analysis; bismuth compounds; calcium compounds; critical currents; high-temperature superconductors; multifilamentary superconductors; silver; statistical analysis; strontium compounds; superconducting tapes; Bi2223-Ag multifilament tapes; Bi₂Sr₂Ca₂Cu₃O_10+x-Ag; Fourier analysis; MCorder; coated conductors; critical current uniformity; long HTS tapes; long high temperature superconductor tapes; magnetic circuit method; magnetic substrates; periodical artificial defects; section-by-section four-probe method; statistical evaluation; Critical current density (superconductivity); Current measurement; High-temperature superconductors; Magnetic circuits; Superconducting integrated circuits; Superconducting magnets; Critical Current Uniformity; Critical current uniformity; Fourier; HTS tape; Magnetic Circuit; Statistics; magnetic circuit; statistics;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2014.2374418

Filename

6966730