DocumentCode :
565154
Title :
Towards graceful aging degradation in NoCs through an adaptive routing algorithm
Author :
Bhardwaj, Kshitij ; Chakraborty, Koushik ; Roy, Sanghamitra
Author_Institution :
USU Bridge Lab., Utah State Univ., Logan, UT, USA
fYear :
2012
fDate :
3-7 June 2012
Firstpage :
382
Lastpage :
391
Abstract :
Continuous technology scaling has made aging mechanisms such as Negative Bias Temperature Instability (NBTI) and electromigration primary concerns in Network-on-Chip (NoC) designs. In this paper, we model the effects of these aging mechanisms on NoC components such as routers and links using a novel reliability metric called Traffic Threshold per Epoch (TTpE). We observe a critical need of a robust aging-aware routing algorithm that not only reduces power-performance overheads caused due to aging degradation but also minimizes the stress experienced by heavily utilized routers and links. To solve this problem, we propose an aging-aware adaptive routing algorithm and a router microarchitecture that routes the packets along the paths which are both least congested and experience minimum aging stress. After an extensive experimental analysis using real workloads, we observe a 13%, 12.7% average overhead reduction in network latency and Energy-Delay-Product-Per-Flit (EDPPF) and a 10.4% improvement in performance using our aging-aware routing algorithm.
Keywords :
circuit reliability; network routing; network-on-chip; NoC design; aging-aware adaptive routing algorithm; electromigration; energy-delay-product-per-flit; graceful aging degradation; negative bias temperature instability; network-on-chip; reliability metric; router microarchitecture; traffic threshold per epoch; Aging; Algorithm design and analysis; Degradation; Electromigration; Reliability; Routing; Stress; Aging; Electromigration; NBTI; NoC; Routing algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-4503-1199-1
Type :
conf
Filename :
6241536
Link To Document :
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