Title :
Hardware realization of BSB recall function using memristor crossbar arrays
Author :
Hu, Miao ; Li, Hai ; Wu, Qing ; Rose, Garrett S.
Author_Institution :
Polytech. Inst., New York Univ., New York, NY, USA
Abstract :
The Brain-State-in-a-Box (BSB) model is an auto-associative neural network that has been widely used in optical character recognition and image processing. Traditionally, the BSB model was realized at software level and carried out on high-performance computing clusters. To improve computation efficiency and reduce resources requirement, we propose a hardware realization by utilizing memristor crossbar arrays. In this work, we explore the potential of a memristor crossbar array as an auto-associative memory. More specificly, the recall function of a multi-answer character recognition based on BSB model was realized. The robustness of the proposed BSB circuit was analyzed and evaluated based on massive Monte-Carlo simulations, considering input defects, process variations, and electrical fluctuations. The physical constrains when implementing a neural network with memristor crossbar array have also been discussed. Our results show that the BSB circuit has a high tolerance to random noise. Comparably, the correlations between memristor arrays introduces directional noise and hence dominates the quality of circuits.
Keywords :
Monte Carlo methods; content-addressable storage; memristors; neural chips; random noise; BSB circuit; BSB model; BSB recall function; Monte-Carlo simulation; auto-associative memory; auto-associative neural network; brain-state-in-a-box; circuit quality; computation efficiency; directional noise; electrical fluctuation; hardware realization; high-performance computing cluster; image processing; memristor array; memristor crossbar array; multianswer character recognition; optical character recognition; process variation; random noise; resources requirement; software level; Biological neural networks; Brain modeling; Integrated circuit modeling; Memristors; Neurons; Noise; Robustness; BSB model; crossbar array; memristor; neural network; process variation;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1