Title :
X-Tracer: A reconfigurable X-tolerant trace compressor for silicon debug
Author :
Feng Yuan ; Xiao Liu ; Qiang Xu
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Abstract :
The effectiveness of at-speed silicon debug is constrained by the limited trace buffer size and/or trace port bandwidth, requiring highly-efficient trace data compression solutions. As it is usually inevitable to have unknown `X´ values during silicon debug, trace compressor should be equipped with X-tolerance feature in order not to significantly degrade error detection capability. To tackle this problem, this paper presents a novel reconfigurable X-tolerant trace compressor, namely X-Tracer, which is able to tolerate as many X-bits as possible in the trace streams while guaranteeing high compression ratio, at the cost of little extra design-for-debug hardware. Experimental results on benchmark circuits demonstrate the effectiveness of the proposed technique.
Keywords :
benchmark testing; data compression; integrated circuit design; integrated circuit testing; X-Tracer; X-tolerance feature; at-speed silicon debug; benchmark circuit; design-for-debug hardware; error detection capability; reconfigurable X-tolerant trace compressor; trace buffer size; trace data compression solution; trace port bandwidth; Algorithm design and analysis; Data mining; Polynomials; Redundancy; Silicon; Space exploration; Vectors; Silicon Debug; Trace Data Compression; X-Tolerance;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1