Title :
Standard cell routing via Boolean satisfiability
Author :
Ryzhenko, Nikolai ; Burns, Steven
Author_Institution :
Strategic CAD Labs., Intel Corp., Moscow, Russia
Abstract :
We propose a flow for routing nets within a standard cell that 1) generates candidate routes for point-to-point segments; 2) finds conflicts (electrical shorts and geometric design rule violations) between candidate routes; and 3) solves a SAT instance producing a legal and complete routing for all nets in the standard cell. This approach enables routing automation for cutting-edge process technology nodes. We present how to make this technique more effective by introducing pruning techniques to reduce the work required in all three steps. We also show how we can further optimize routing quality within the SAT formulation through the use of successively more stringent constraints. Recent improvements in the speed of SAT solvers make such a formulation practical for even complex standard cells. A routing tool based on our SAT formulation is currently being used to route real industrial standard cell layouts. It demonstrates acceptable runtime and 89% coverage of our industrial standard cell library, including scan flip-flops, adders, and multiplexers. We also observe a significant reduction in amount of metal 2 routing in comparison with industrial hand-crafted standard cells.
Keywords :
Boolean functions; computability; logic circuits; network routing; Boolean satisfiability; SAT formulation; SAT instance; SAT solvers; complex standard cells; cutting-edge process technology nodes; formulation practical; industrial hand-crafted standard cells; industrial standard cell library; multiplexers; optimize routing quality; point-to-point segment; pruning technique; route real industrial standard cell layout; routing automation; routing nets; routing tool; standard cell routing; stringent constraints; Computer architecture; Law; Layout; Microprocessors; Routing; Standards; Wires; Boolean Satisfiability; Layout Automation; Standard Cells;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1