• DocumentCode
    565208
  • Title

    PADE: A high-performance placer with automatic datapath extraction and evaluation through high-dimensional data learning

  • Author

    Ward, Samuel ; Ding, Duo ; Pan, David Z.

  • Author_Institution
    ECE Dept., Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    756
  • Lastpage
    761
  • Abstract
    This work presents PADE, a new placement flow with automatic datapath extraction and evaluation. PADE applies novel data learning techniques to train, predict, and evaluate potential datapaths using high-dimensional data such as netlist symmetrical structures, initial placement hints and relative area. Extracted datapaths are mapped to bit-stack structures that are aligned and simultaneously placed with the random logic using SAPT [1], the SAPT, a placer built on top of SimPL [2]. Results show at least 7% average total Half-Perimeter Wire Length (HPWL) and 12% Steiner Wire Length (StWL) improvements on industrial hybrid benchmarks and at least 2% average total HPWL and 3% StWL improvements on ISPD 2005 contest benchmarks. To the best of our knowledge, this is the first attempt to link data learning, datapath extraction with evaluation, and placement and has the tremendous potential for pushing placement state-of-the-art for modern circuits which have datapath and random logics.
  • Keywords
    data handling; learning (artificial intelligence); logic circuits; HPWL; ISPD 2005 contest benchmarks; PADE; SAPT; SimPL; StWL; Steiner wire length; automatic datapath evaluation; automatic datapath extraction; bit-stack structures; half-perimeter wire length; high-dimensional data; high-dimensional data learning; high-performance placer; initial placement hints; netlist symmetrical structures; placement flow; random logic; relative area; Accuracy; Benchmark testing; Data mining; Feature extraction; Generators; Support vector machines; Training; Datapath; Extraction; Physical Design; Placement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241590