DocumentCode
565235
Title
Automated feature localization for hardware designs using coverage metrics
Author
Malburg, Jan ; Finder, Alexander ; Fey, Görschwin
Author_Institution
Univ. of Bremen, Bremen, Germany
fYear
2012
fDate
3-7 June 2012
Firstpage
941
Lastpage
946
Abstract
Due to the increasing complexity modern System on Chip designs are developed by large design teams. In addition, existing design blocks are re-used such that the knowledge about these parts of the design entirely depends on the quality of the documentation. For a single designer it is almost impossible to have detailed knowledge about all blocks and their interaction. We introduce a simulation-based automation technique to support design understanding. Based on use cases provided by the designer and on their coverage information, the proposed technique identifies parts of the source code that are relevant for a certain functional feature. In two case studies the technique is shown to be at least as exact as reading the documentation with two important advantages: the automated approach is fast and more precise than the existing documentation for the inspected designs.
Keywords
electronic design automation; integrated circuit design; system-on-chip; automated feature localization; coverage metrics; documentation quality; functional feature; hardware designs; inspected designs; simulation-based automation technique; source code identification; system-on-chip designs; Color; Documentation; Hardware; Hardware design languages; Measurement; Prototypes; Software; Design Understanding; Feature Localization; Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-4503-1199-1
Type
conf
Filename
6241617
Link To Document