• DocumentCode
    565235
  • Title

    Automated feature localization for hardware designs using coverage metrics

  • Author

    Malburg, Jan ; Finder, Alexander ; Fey, Görschwin

  • Author_Institution
    Univ. of Bremen, Bremen, Germany
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    941
  • Lastpage
    946
  • Abstract
    Due to the increasing complexity modern System on Chip designs are developed by large design teams. In addition, existing design blocks are re-used such that the knowledge about these parts of the design entirely depends on the quality of the documentation. For a single designer it is almost impossible to have detailed knowledge about all blocks and their interaction. We introduce a simulation-based automation technique to support design understanding. Based on use cases provided by the designer and on their coverage information, the proposed technique identifies parts of the source code that are relevant for a certain functional feature. In two case studies the technique is shown to be at least as exact as reading the documentation with two important advantages: the automated approach is fast and more precise than the existing documentation for the inspected designs.
  • Keywords
    electronic design automation; integrated circuit design; system-on-chip; automated feature localization; coverage metrics; documentation quality; functional feature; hardware designs; inspected designs; simulation-based automation technique; source code identification; system-on-chip designs; Color; Documentation; Hardware; Hardware design languages; Measurement; Prototypes; Software; Design Understanding; Feature Localization; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241617