Title :
Timing analysis with nonseparable statistical and deterministic variations
Author :
Zolotov, Vladimir ; Sinha, Debjit ; Hemmett, Jeffrey ; Foreman, Eric ; Visweswariah, Chandu ; Xiong, Jinjun ; Leitzen, Jeremy ; Venkateswaran, Natesan
Author_Institution :
Thomas J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
Abstract :
Statistical static timing analysis (SSTA) is ideal for random variations but is not suitable for environmental variations like Vdd and temperature. SSTA uses statistical approximation, according to which circuit timing is predicted accurately only for highly probable combinations of variational parameters. SSTA is not able to handle accurately deterministic sources of variation like supply voltage. This paper presents a novel technique for modeling nonseparable deterministic and statistical variations in single timing run.
Keywords :
VLSI; statistical analysis; timing circuits; SSTA; VLSI circuits; circuit timing; deterministic variations; environmental variations; nonseparable statistical variation; statistical approximation; statistical static timing analysis; Computational modeling; Delay; Integrated circuit modeling; Interpolation; Sensitivity; Static Timing; Statistical Timing; Variability;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1