Title :
Near-threshold voltage (NTV) design — Opportunities and challenges
Author :
Kaul, Himanshu ; Anders, Mark ; Hsu, Steven ; Agarwal, Amit ; Krishnamurthy, Ram ; Borkar, Shekhar
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
Moore´s Law will continue providing abundance of transistors for integration, only to be limited by the energy consumption. Near threshold voltage (NTV) operation has potential to improve energy efficiency by an order of magnitude. We discuss design techniques necessary for reliable operation over a wide range of supply voltage - from nominal down to subthreshold region. The system designed for NTV can dynamically select modes of operation, from high performance, to high energy efficiency, to the lowest power.
Keywords :
VLSI; integrated circuit design; integrated circuit reliability; Moore Law; NTV; VLSI technology scaling; energy consumption; energy efficiency improvement; near-threshold voltage design; subthreshold region; Energy efficiency; Flip-flops; Frequency measurement; Logic gates; Multiplexing; Threshold voltage; Transistors; NTV; energy; performance; power; subthreshold;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1
