• DocumentCode
    566270
  • Title

    Effect of frequency in the 3D integration of a PZT-actuated MEMS switch using a single crystal silicon asymmetric beam

  • Author

    Nakazawa, Fumihiko ; Shimanouchi, Takeaki ; Nakatani, Tadashi ; Katsuki, Takashi ; Okuda, Hisao ; Toyoda, Osamu ; Ueda, Satoshi

  • Author_Institution
    3D-Integration Technol. Res. Dept., Assoc. of Super-Adv. Electron. Technol., Tokyo, Japan
  • fYear
    2012
  • fDate
    Jan. 31 2012-Feb. 2 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents the effect of frequency of radio frequency microelectromechanical system (RF MEMS) 3D integration with an actual device. A piezoelectric transducer (PZT)-actuated RF MEMS switch that uses a single crystal silicon asymmetric beam was designed, fabricated, and evaluated. We successfully drove a stiff beam (with spring constant >; 2,000 N/m) despite a low voltage (<;15 V). The switch lifetime was 4 × 107 cycles at low contact resistance and more than 1 × 109 cycles for the PZT actuator. The overall insertion loss and isolation were -0.3 dB and -25 dB, respectively, up to 5GHz. The effect of frequency of 3D integration was simulated with an RF MEMS switch and a ground plane placed over it. We discovered that a 3D IC comprising a control IC and an RF MEMS switch with a distance of more than 80 μm was successfully integrated.
  • Keywords
    elemental semiconductors; microswitches; microwave switches; piezoelectric transducers; silicon; three-dimensional integrated circuits; 3D integration; PZT; PZT actuator; PZT-actuated MEMS switch; RF MEMS frequency; contact resistance; ground plane; insertion loss; piezoelectric transducer; single-crystal silicon asymmetric beam; switch lifetime; Actuators; Contact resistance; Micromechanical devices; Microswitches; Radio frequency; 3D integration; RF-MEMS switch; effect of frequency; piezoelectric actuator; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3D Systems Integration Conference (3DIC), 2011 IEEE International
  • Conference_Location
    Osaka
  • Print_ISBN
    978-1-4673-2189-1
  • Type

    conf

  • DOI
    10.1109/3DIC.2012.6263007
  • Filename
    6263007