DocumentCode :
567078
Title :
Characterization of Hollow-core Silicon Nanowires
Author :
Yingli, Wang ; Houhu, Lai ; Ming, Wang
Author_Institution :
Meas. & Control Technol. & Commun. Eng., Haerbin Univ. of Sci. & Technol., Harbin, China
Volume :
1
fYear :
2012
fDate :
18-20 May 2012
Firstpage :
153
Lastpage :
157
Abstract :
This project investigates the performance characteristics of Hollow-core Silicon Nanowires, specially the confinement in each layer of the slot waveguide. In order to undertake such analysis, an accurate and efficient full-vectorial Finite Element Method (FEM) is used to calculate the propagation constant and the modal field profiles of the optical waveguide. The variation of effective indices, effective areas, power density in slot region and the confinement factors of the slot waveguide are rigorous investigated. The modal magnetic and electric field profiles are also presented.
Keywords :
confinement; power density; waveguide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measurement, Information and Control (MIC), 2012 International Conference on
Conference_Location :
Harbin, China
Print_ISBN :
978-1-4577-1601-0
Type :
conf
DOI :
10.1109/MIC.2012.6273245
Filename :
6273245
Link To Document :
بازگشت