Title :
Based on Markov model analyze a new RAID reliability
Author :
Lu, Jian-jun ; Zhang, Xiao ; Zhou, Xiao-Peng
Author_Institution :
Sch. of Comput. Sci., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
Now the number of disks in Mass Storage System is on the increase, and Hard disk drive failure already is not small probability events. In mass storage system RAID technique commonly used to prevent a disk failure. RAID can save data and check data, when a disk becomes a failure disk, the lost data in the disk can be recovered through fine data and check data. For RAID5, when a disk is recovering, another disk fails, then the data will be lost forever. So Improve the disk rebuild speed can be shorten the RAID degraded running time, improve storage system availability and reliability. This article describes a new RAID data layout to improve disk recovery speed and reliability.
Keywords :
Markov processes; RAID; disc drives; hard discs; integrated circuit layout; integrated circuit reliability; Markov model; RAID data layout; RAID reliability; RAID5; disk rebuild speed improvement; disk recovery reliability improvement; disk recovery speed improvement; hard disk drive failure; mass storage system; short RAID degraded running time; Absorption; Analytical models; Data models; Educational institutions; Layout; Markov processes; Reliability; RAID; markov; reliability;
Conference_Titel :
Computer Science & Education (ICCSE), 2012 7th International Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-0241-8
DOI :
10.1109/ICCSE.2012.6295059