• DocumentCode
    568284
  • Title

    Secondary image reconstruction based on Associative Markov Networks for electrical resistance tomography

  • Author

    Ye, Jiamin ; Hoyle, Brian S.

  • Author_Institution
    Sch. of Process, Environ. & Mater. Eng., Univ. of Leeds, Leeds, UK
  • fYear
    2012
  • fDate
    16-17 July 2012
  • Firstpage
    482
  • Lastpage
    487
  • Abstract
    The images reconstructed by electrical resistance tomography for two-phase flow with distinctive phase origins are usually blurred at the phase interface. To improve the image quality, secondary image reconstruction with Associative Markov Networks (AMNs) is presented. The initial images are reconstructed by the Landweber iteration algorithm. The obtained images are then processed using AMNs. The weights of AMNs are learned by a quadratic program and then a min-cut is used for the maximum a posteriori inference to obtain the optimal images. Simulation results from both noise-free and noisy data show significant improvement in the phase interface of images. For some conductivity distributions, the image errors can be reduced to a fifth of the initial values.
  • Keywords
    Markov processes; computerised instrumentation; electric impedance imaging; image reconstruction; inference mechanisms; iterative methods; quadratic programming; AMN; Landweber iteration algorithm; associative Markov networks; conductivity distributions; distinctive phase origins; electrical resistance tomography; maximum a posteriori inference; min-cut; optimal images; phase interface; quadratic program; secondary image reconstruction; two-phase flow; Conductivity; Electrodes; Image reconstruction; Imaging phantoms; Markov random fields; Phantoms; Vectors; associative Markov networks; electrical resistance tomography; regularization; secondary imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
  • Conference_Location
    Manchester
  • Print_ISBN
    978-1-4577-1776-5
  • Type

    conf

  • DOI
    10.1109/IST.2012.6295495
  • Filename
    6295495