DocumentCode :
568284
Title :
Secondary image reconstruction based on Associative Markov Networks for electrical resistance tomography
Author :
Ye, Jiamin ; Hoyle, Brian S.
Author_Institution :
Sch. of Process, Environ. & Mater. Eng., Univ. of Leeds, Leeds, UK
fYear :
2012
fDate :
16-17 July 2012
Firstpage :
482
Lastpage :
487
Abstract :
The images reconstructed by electrical resistance tomography for two-phase flow with distinctive phase origins are usually blurred at the phase interface. To improve the image quality, secondary image reconstruction with Associative Markov Networks (AMNs) is presented. The initial images are reconstructed by the Landweber iteration algorithm. The obtained images are then processed using AMNs. The weights of AMNs are learned by a quadratic program and then a min-cut is used for the maximum a posteriori inference to obtain the optimal images. Simulation results from both noise-free and noisy data show significant improvement in the phase interface of images. For some conductivity distributions, the image errors can be reduced to a fifth of the initial values.
Keywords :
Markov processes; computerised instrumentation; electric impedance imaging; image reconstruction; inference mechanisms; iterative methods; quadratic programming; AMN; Landweber iteration algorithm; associative Markov networks; conductivity distributions; distinctive phase origins; electrical resistance tomography; maximum a posteriori inference; min-cut; optimal images; phase interface; quadratic program; secondary image reconstruction; two-phase flow; Conductivity; Electrodes; Image reconstruction; Imaging phantoms; Markov random fields; Phantoms; Vectors; associative Markov networks; electrical resistance tomography; regularization; secondary imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
Conference_Location :
Manchester
Print_ISBN :
978-1-4577-1776-5
Type :
conf
DOI :
10.1109/IST.2012.6295495
Filename :
6295495
Link To Document :
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