Title :
A digital demodulation method for electrical tomography based on sine wave rectification
Author :
Zhou, Haili ; Xu, Lijun ; Cao, Zhang ; Fan, Shangchun ; Pei, Hong
Author_Institution :
Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China
Abstract :
In this paper, a digital demodulation method used for AC-based electrical tomography systems is presented. The demodulation result can be easily obtained by rectifying the sinusoidal measurement signal in a digital way. The proposed demodulation method has some distinguished characteristics: (a) with a concise configuration, it can be implemented on simple digital signal processors without hardware multipliers, e.g. Complex Programmable Logic Device (CPLD); (b) no reference signals are involved, (c) according to the requirements of precision and Signal-to-Noise Ratio (SNR), the demodulation process can be accomplished within k/2 (k=1, 2, 3, ...) sine wave periods; and (d) the effectiveness of the proposed method is not influenced by the starting time of demodulation. Mathematical analysis and numerical simulation results are presented to prove the feasibility and effectiveness of the digital demodulation method based on sine wave rectification.
Keywords :
demodulation; programmable logic devices; signal processing; tomography; waveform generators; AC-based electrical tomography system; CPLD; SNR; complex programmable logic device; demodulation process; digital demodulation method; digital signal processor; hardware multiplier; mathematical analysis; numerical simulation; reference signals; signal-to-noise ratio; sine wave period; sine wave rectification; sinusoidal measurement signal rectification; Demodulation; Digital signal processors; Frequency measurement; Hardware; Phase measurement; Signal to noise ratio; Tomography; AC-based; Digital demodulation; Electrical tomography; Sine wave rectification;
Conference_Titel :
Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
Conference_Location :
Manchester
Print_ISBN :
978-1-4577-1776-5
DOI :
10.1109/IST.2012.6295530