Title :
Electric field simulation in electrical capacitance tomography
Author :
Kryszyn, Jacek ; Smolik, Waldemar T. ; Szabatin, Roman ; Mirkowski, Jacek
Author_Institution :
Fac. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
The applications of electric capacitance tomography require a custom-designed sensor with individually calculated sensitivity matrix. The sensor can be modeled using an electric field simulator. A highly advanced simulator QuickWave-3D was applied to generate a sensitivity matrix for a designed sensor. The calculation results are presented and compared with the results obtained using custom FEM software packages elaborated previously by our group. The custom solvers enable fast computation but simulate electric field in 2D and use regular square mesh which can cause insufficient discretization in some regions. In this paper the comparison of results obtained by two types of FEM solvers is presented. The comparison enables also a validation of 2D modeling and application of regular discretization mesh in our custom solvers.
Keywords :
capacitance measurement; computerised tomography; electric impedance imaging; image sensors; matrix algebra; mesh generation; sensitivity; FEM software package; QuickWave-3D; custom designed sensor; electric field simulation; electrical capacitance tomography; regular discretization mesh; regular square mesh; sensitivity matrix; Capacitance; Electric fields; Electrodes; Image reconstruction; Mathematical model; Permittivity; Sensitivity; Electrical capacitance tomography; Electromagnetic field; FEM; Sensitivity matrix;
Conference_Titel :
Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
Conference_Location :
Manchester
Print_ISBN :
978-1-4577-1776-5
DOI :
10.1109/IST.2012.6295592
