Title :
Impact of Logic Synthesis on Soft Error Rate of Digital Integrated Circuits
Author :
Limbrick, Daniel B.
Abstract :
Reliability-aware synthesis exploits the properties of fault masking to improve the reliability of logic circuits. My dissertation investigates how synthesis constraints can impact the effectiveness of this technique.
Keywords :
circuit reliability; digital integrated circuits; logic circuits; radiation hardening (electronics); digital integrated circuits; dissertation; logic circuits; logic synthesis; reliability-aware synthesis; soft error rate; Circuit faults; Error analysis; Integrated circuit reliability; Optical fibers; SPICE; Transient analysis; combinational logic; logic synthesis; reliability-aware synthesis; soft errors;
Conference_Titel :
VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
Conference_Location :
Amherst, MA
Print_ISBN :
978-1-4673-2234-8
DOI :
10.1109/ISVLSI.2012.67
