Title :
Metamodel-Assisted Fast and Accurate Optimization of an OP-AMP for Biomedical Applications
Author :
Zheng, Geng ; Mohanty, Saraju P. ; Kougianos, Elias
Author_Institution :
NanoSystem Design Lab., Univ. of North Texas, Denton, TX, USA
Abstract :
The optimized OP-AMPs resulting out of a traditional flows, although may meet the given specifications after consuming significant design cycle time, do not guarantee an optimal system performance. In this paper, a three-step polynomial metamodel-assisted OP-AMP optimization flow is proposed to address these issues. The flow incorporate polynomial metamodeling, Verilog-AMS integration, and a customized Cuckoo Search optimization. To the best of the authors´ knowledge, this paper for the first time presents such a design flow for state-of-the art OP-AMP optimization. Highly accurate and ultra-fast (~17000× speedup compared to traditional methods) polynomial metamodels are generated to estimate OP-AMP performance. An OP-AMP meta-macro model is constructed and is integrated into a Verilog-AMS module (called Verilog-AMS-POM) to facilitate fast time-domain simulations. The core optimization module is a customized Cuckoo Search algorithm which produces promising optimized results. The OP-AMP power dissipation is reduced from 252.8 μW to 65.5 μW (3.86× improvement).
Keywords :
biomedical electronics; operational amplifiers; polynomials; search problems; time-domain analysis; OP-AMP metamacromodel; OP-AMP power dissipation; biomedical applications; core optimization module; customized cuckoo search algorithm; metamodel-assisted fast optimization; operational amplifier; power 252.8 muW to 65.5 muW; three-step polynomial metamodel-assisted OP-AMP optimization flow; time-domain simulations; Algorithm design and analysis; Gain; Hardware design languages; Integrated circuit modeling; Optimization; Polynomials; Transfer functions; OP-AMP; Verilog-AMS modeling; design optimization; macromodel; metamodel;
Conference_Titel :
VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
Conference_Location :
Amherst, MA
Print_ISBN :
978-1-4673-2234-8
DOI :
10.1109/ISVLSI.2012.11