DocumentCode :
56881
Title :
Pressure-Sensitive Sampling Wands for Homeland Security Applications
Author :
Staymates, Matthew E. ; Grandner, Jessica ; Verkouteren, Jennifer R.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
13
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
4844
Lastpage :
4850
Abstract :
This paper discusses the use of force sensing resistor (FSR) technology integrated into sampling wands used for homeland security applications. FSR-integrated wands can be used for the optimization of wipe sampling of surfaces to facilitate enhanced trace contraband collection. Collection efficiencies during wipe sampling are known to be dependent on the applied force, or pressure, used during sampling. Light-emitting diodes designed to switch from red to green at a defined force threshold of 7 N provide feedback to the operator during sampling. The goal of maintaining forces at or above the threshold was successfully demonstrated by testing with a volunteer population of 22. An additional benefit is the reduction in the variability of the force applied by each operator during sampling. Another focus area is the development of prototype sampling wands that fit in the palm of the hand and other wand modifications that increase the reliability of wipe sampling by registering the placement of the collected sample properly on the wipe. This paper also outlines how an array-based FSR can be used to visualize contact area and pressure during wipe sampling.
Keywords :
explosive detection; force sensors; light emitting diodes; national security; resistors; sampling methods; force sensing resistor technology; homeland security applications; light-emitting diodes; pressure-sensitive sampling wands; trace contraband collection; trace detection; wipe sampling optimization; Calibration; Explosives; Force; Force measurement; Light emitting diodes; Loading; Materials; Explosives; narcotics; particle collection; trace detection; wipe sampling;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2013.2274573
Filename :
6567911
Link To Document :
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